Work

Specific Characterization for Destructive Single Event Effects on GaAs Power P-HEMT MMIC

Year: 2013

Type: conference-paper

Source: IEEE Radiation Effects Data Workshop (REDW)

DOI: 10.1109/redw.2013.6658216

Authors: R. Marec, A. Bensoussan, J. L. Muraro, L. Portal, P. Calvel, C. Barillot, M. G. Perichaud, L. Marchand, G. Vignon

Institutions: Thales Alenia Space (France), European Space Research and Technology Centre, European Space Agency

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2016509723

FWCI: 0.407

Cites: 11

Cited by: 8

Related to: 10