Work

Simple Diophantine test for the validity of conventional deep level transient spectroscopy

Year: 1994

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.111825

Authors: Dobri Batovski, Chavdar Hardalov

Institution: Sofia University "St. Kliment Ohridski"

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2016564052

FWCI: 0.626

Cites: 3

Cited by: 3

Related to: 10