Work

Measurement of the Refraction Effect of the Diffracted W-Rays from a Silicon Single Crystal

Year: 1965

Type: article

Source: Journal of the Physical Society of Japan

DOI: 10.1143/jpsj.20.1959

Authors: K. Kohra, S. Kikuta, S. Nakano

Institution: The University of Tokyo

Language: English

Topic: Crystallography and Radiation Phenomena

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2016691771

FWCI:

Cites: 2

Cited by: 27

Related to: 10