Work

Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz

Year: 2014

Type: article

Source: Journal of Applied Physics

DOI: 10.1063/1.4897922

Authors: M. Kasper, G. Gramse, J. Hoffmann, C. Gaquiere, R. Feger, A. Stelzer, J. Smoliner, F. Kienberger

Institutions: Johannes Kepler University of Linz, Swiss Federal Institute of Metrology, TU Wien, Keysight Technologies (Austria)

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Directorate-General for Research and Innovation

Award: G7509589811

OpenAlex ID: W2016903858

FWCI: 1.075

Cites: 20

Cited by: 20

Related to: 10