Work

Effective recognition of control chart patterns in autocorrelated data using a support vector machine based approach

Year: 2011

Type: article

Source: Computers & Industrial Engineering

DOI: 10.1016/j.cie.2011.06.025

Authors: Shih-Yen Lin, Ruey-Shiang Guh, Yeou-Ren Shiue

Institutions: National Chi Nan University, National Formosa University, Huafan University

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

Funder: National Science Council

OpenAlex ID: W2017018726

FWCI: 1.418

Cites: 52

Cited by: 63

Related to: 10