Work

EBIC and TEM analysis of catastrophic optical damage in high-power GaAlAs/GaInAs lasers

Year: 1997

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.273827

Authors: Robert E. Mallard, Rick D. Clayton

Institution: Nortel (Canada)

Language: English

Topic: Semiconductor Lasers and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2017046009

FWCI: 1.3

Cites:

Cited by: 11

Related to: 10