Work

Contour Control Point Algorithms For Shape Measurement And Inspection

Year: 1987

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.937864

Authors: David W. Paglieroni, Anil K. Jain

Institution: University of California System

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2017123871

FWCI: 10.02

Cites:

Cited by: 8

Related to: 10