Detection for low light leakage based on CCD and image processing technology
Year: 2009
Type: conference-paper
DOI: 10.1117/12.836004
Authors: Ting-wan Wu, Cui Yin, Yi-hui Duan
Institution: South China University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2017133228