Work

A two-phase dynamic dispatching approach to semiconductor wafer testing

Year: 2011

Type: article

Source: Robotics and Computer-Integrated Manufacturing

DOI: 10.1016/j.rcim.2011.02.007

Authors: Yin-Yann Chen, James T. Lin, Tzu-Li Chen

Institutions: Fu Jen Catholic University, National Formosa University, National Tsing Hua University

Language: English

Topic: Scheduling and Optimization Algorithms

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2017177261

FWCI: 2.107

Cites: 17

Cited by: 12

Related to: 10