Product
Help
Pricing
About
Jobs
Log in
Get started
Work
Add to collection
EUV and soft x-ray multilayer optics
HTML
Details
Locations
Year:
2004
Type:
conference-paper
Source:
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
DOI:
10.1117/12.512502
Authors:
Norbert Kaiser,
Sergiy Yulin,
Torsten Feigl,
Helmut Bernitzki,
Hans Lauth
Institutions:
Fraunhofer Institute for Applied Optics and Precision Engineering,
Jenoptik (Germany)
Language:
English
Topic:
Advanced X-ray Imaging Techniques
Subfield:
Radiation
Field:
Physics and Astronomy
Domain:
Physical Sciences
Open Access status:
closed
OpenAlex ID:
W2017193490
FWCI:
2.081
Cites:
Cited by:
10
Related to:
10