Algorithm comparison for high impedance fault detection based on staged fault test
Year: 1988
Type: article
DOI: 10.1109/61.193941
Authors: Ching-Lien Huang, Hui-Yung Chu, Ming-Tong Chen
Institution: National Cheng Kung University
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2017196030
