Work

Hardness Assurance Guidelines for Moderate Neutron Environment Effects in Bipolar Transistors and Integrated Circuits

Year: 1978

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.1978.4329571

Authors: Robert A. Berger, Joseph L. Azarewicz, Harvey Eisen

Institution: Harry Diamond Laboratories

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2017209672

FWCI: 0.657

Cites: 12

Cited by: 3

Related to: 10