Work

Extreme temperature 6H‐SiC JFET integrated circuit technology

Year: 2009

Type: article

Source: physica status solidi (a)

DOI: 10.1002/pssa.200925188

Authors: Philip G. Neudeck, Steven L. Garverick, David J. Spry, Liang‐Yu Chen, Glenn M. Beheim, Michael J. Krasowski, Mehran Mehregany

Institutions: Glenn Research Center, Case Western Reserve University, Ohio Aerospace Institute

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2017222782

FWCI: 5.818

Cites: 34

Cited by: 141

Related to: 10