Work

Tunnel DCIV diagnosis of ultrathin gate oxide metal-oxide-silicon transistors

Year: 2004

Type: article

Source: Semiconductor Science and Technology

DOI: 10.1088/0268-1242/19/7/016

Authors: Bin B Jie, K F Lo, Elgin Quek, Sanford Chu, Chih-Tang Sah

Institution: University of Florida

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2017538739

FWCI: 0.977

Cites: 12

Cited by: 3

Related to: 10