Work

Non-destructive threshold assessment of a pinned photo diode pixel with correlated double sampling

Year: 2014

Type: conference-paper

Source: IEEE International Symposium on Consumer Electronics (ISCE)

DOI: 10.1109/isce.2014.6884513

Authors: Michael Guidash, Thomas Vogelsang

Institution: Rambus (United States)

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2017573408

FWCI: 0.401

Cites: 2

Cited by: 2

Related to: 10