Work

Quantitative Masking Strength: Quantifying the Power Side-Channel Resistance of Software Code

Year: 2015

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2015.2424951

Authors: Hassan Eldib, Chao Wang, Mostafa Taha, Patrick Schaumont

Institutions: Virginia Tech, Worcester Polytechnic Institute

Language: English

Topic: Cryptographic Implementations and Security

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Foundation, Office of Naval Research

OpenAlex ID: W2017609955

FWCI: 2.652

Cites: 45

Cited by: 23

Related to: 10