Work

Monte Carlo simulation of charge exchange processes in the scattering of 4keV He+ ions by an amorphous silicon surface

Year: 2006

Type: article

Source: Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

DOI: 10.1016/j.nimb.2006.12.085

Authors: K. Khalal-Kouache, A.C. Chami, M. Boudjema, C. Benazeth

Institutions: University of Sciences and Technology Houari Boumediene, Centre National de la Recherche Scientifique, Université Toulouse III - Paul Sabatier, Laboratoire Collisions Agrégats Réactivité

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2017783291

FWCI: 0.241

Cites: 19

Cited by: 2

Related to: 10