Work

On the initial temporal current characteristics of thin oxide devices depending on constant voltage pulse sequences

Year: 2000

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/s0026-2714(99)00298-x

Authors: J.-W Zahlmann-Nowitzki, L Nebrich, M Wiatr, P Seegebrecht

Institution: Christian-Albrechts-Universität zu Kiel

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2018047400

FWCI: 1.69

Cites: 3

Cited by: 4

Related to: 10