Work

SEE test and modeling results on 45nm SRAMs with different well strategies

Year: 2010

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2010.5488794

Authors: Gilles Gasiot, Slawosz Uznanski, Philippe Roche

Institution: STMicroelectronics (France)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2018081820

FWCI: 2.139

Cites: 6

Cited by: 11

Related to: 10