Work

Obtaining the structure factors for an epitaxial film using Cu X-ray radiation

Year: 2013

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s002188981302414x

Authors: P. Wadley, A. Crespi, J. Gázquez, M.A. Roldán, P. García, V. Novak, R. Campion, T. Jungwirth, C. Rinaldi, X. Martí, V. Holy, C. Frontera, J. Rius

Institutions: University of Nottingham, FZU - Institute of Physics of the Czech Academy of Sciences, Institut de Ciència de Materials de Barcelona, Universidad Complutense de Madrid, Oak Ridge National Laboratory, Politecnico di Milano, Charles University, University of California, Berkeley

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2018183369

FWCI: 0.709

Cites: 10

Cited by: 16

Related to: 10