Residual stresses in (Zr,Hf)N films (up to 11.9 at.% Hf) measured by X-ray diffraction using experimentally calculated XECs
Year: 2004
Type: article
Source: Surface and Coatings Technology
Authors: E. Atar, C. Sarioglu, H. Cimenoglu, E.S. Kayali
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: green
Funder: Istanbul Teknik Üniversitesi
OpenAlex ID: W2018306876