Year: 1990
Type: article
Abstract: A 300 kV ultrahigh resolution analytical electron microscope (UHRAEM), has been newly developed on the base of JEM-2010 [1].Intended for atomic-level observation and analysis in the materials science field, this instrument is provided with a variety of results of new technolo- gies such as a compact 300 kV electron gun, a 4-stage independent illumination lens system, a new C/0 lens [2-5], a new cantilever-type goniometer, new specimen holders, motor control for the 5 axes (X, V, X-tilt, Y-tilt), a new type direct-coupling SIP for attaining clean vacuum, and a new EDS with improved analysis sensitivity.There are two versions; the UHR version, intended for ultrahigh resolution observation with a point resolution of 0.17 nm and the multi-purpose HT version, featuring specimen high tilt angles as large as ±40° and heating and cooling holders.The external view of the JEM-3010 is shown in figure 1.
Institution: JEOL (Japan)
Language: English
Subfield: Structural Biology
Domain: Life Sciences
Open Access status: bronze
OpenAlex ID: W2018354159