Work

Quantitative imaging of InGaAs/GaAs layers using transmission electron microscopy methods: characterization of stresses and chemical composition

Year: 2002

Type: article

Source: Journal of Crystal Growth

DOI: 10.1016/s0022-0248(01)02297-7

Authors: K. Leifer, P.A. Buffat, J. Cagnon, E. Kapon, A. Rudra, P.A. Stadelmann

Institution: École Polytechnique Fédérale de Lausanne

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: green

OpenAlex ID: W2018418482

FWCI: 0.31

Cites: 10

Cited by: 18

Related to: 10