Absorption and dispersion of low-loss dielectrics measured with microwave transient radiation
Year: 1989
Type: article
Source: Electronics Letters
DOI: 10.1049/el:19890358
Institution: IBM Research - Thomas J. Watson Research Center
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2018684733