Work

Heavy ion test results of RHBD standard cells and memory in a 110nm bulk CMOS process

Year: 2014

Type: conference-paper

Source: IEEE Aerospace Conference (AERO)

DOI: 10.1109/aero.2014.6836526

Authors: Eric Cameron, Lowell Miles, Sterling Whitaker, Gary Maki, Matt Shreve

Institution: ON Semiconductor (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Texas A and M University, Goddard Space Flight Center

OpenAlex ID: W2018750392

FWCI: 0.401

Cites: 1

Cited by: 2

Related to: 10