Work

Sensing margin trend with technology scaling in MRAM

Year: 2010

Type: article

Source: International Journal of Circuit Theory and Applications

DOI: 10.1002/cta.635

Authors: Jee‐Hwan Song, Jisu Kim, Seung H. Kang, Sei‐Seung Yoon, Seong‐Ook Jung

Institutions: Yonsei University, Qualcomm (United States)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2019369293

FWCI: 1.51

Cites: 29

Cited by: 22

Related to: 10