Work

Spectrographic ellipsometry study of a liquid crystal display substrate consisting of thin films of SiO2, polyimide and indium tin oxide on glass

Year: 2011

Type: article

Source: Thin Solid Films

DOI: 10.1016/j.tsf.2011.02.041

Authors: Clinton Braganza, L.C. Chien, M.R. Fisch, R.G. Petschek

Institutions: Kent State University, Case Western Reserve University

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Office of Naval Research

OpenAlex ID: W2019611432

FWCI:

Cites: 21

Cited by: 3

Related to: 10