Work

Transmission cathodoluminescence: A new SEM technique to study defects in bulk semiconductor samples

Year: 1979

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.90840

Authors: A. K. Chin, H. Temkin, R. J. Roedel

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2019841971

FWCI: 2.663

Cites: 5

Cited by: 34

Related to: 10