Work

MICROSCOPIC DEFECTS IN SEMI-INSULATING GaAs AND THEIR EFFECT ON THE FET DEVICE CHARACTERISTICS

Year: 1990

Type: book-chapter

Source: Defect Control in Semiconductors

DOI: 10.1016/b978-0-444-88429-9.50053-7

Authors: Hiromasa YAMAMOTO, Haruhito SHIMAKURA, Gaku KANO, Mitsuaki SEIWA, Hirofumi NAKATA, Osamu ODA

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W201999560

FWCI:

Cites: 11

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Related to: 10