Work

PIXE analysis of intermediate and thick targets via line intensity ratios

Year: 1984

Type: article

Source: Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

DOI: 10.1016/0168-583x(84)90363-x

Authors: S. Bauman, P.D. Houmere, J.W. Nelson, R.A. Eldred, T.A. Cahill

Institutions: Florida State University, University of California, Davis

Language: English

Topic: X-ray Spectroscopy and Fluorescence Analysis

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2020104183

FWCI: 1.126

Cites: 13

Cited by: 9

Related to: 10