Work

Z-contrast dependence of quantitative scanning transmission electron microscopy image of Si1−Ge binary crystals

Year: 2014

Type: article

Source: Journal of Alloys and Compounds

DOI: 10.1016/j.jallcom.2014.08.230

Authors: Suhyun Kim, Younheum Jung, Joong Jung Kim, Sunyoung Lee, Haebum Lee

Institutions: Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2020115751

FWCI: 0.524

Cites: 45

Cited by: 10

Related to: 10