Work

Laser simulation of single-event upset in a p-well CMOS counter

Year: 1989

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/23.34655

Authors: J.A. Mazer, K. Kang, S. Buchner

Institution: Martin Marietta (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2020565638

FWCI: 0.461

Cites: 3

Cited by: 8

Related to: 10