Work

Optical near-field photocurrent spectroscopy: A new technique for analyzing microscopic aging processes in optoelectronic devices

Year: 1996

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.117844

Authors: A. Richter, J. W. Tomm, Ch. Lienau, J. Luft

Institutions: Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy, Siemens (Germany)

Language: English

Topic: Semiconductor Lasers and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2022319005

FWCI: 5.127

Cites: 1

Cited by: 37

Related to: 10