Work

Impact of Source–Drain Series Resistance on Drain Current Mismatch in Advanced Fully Depleted SOI n-MOSFETs

Year: 2015

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/led.2015.2411289

Authors: E. G. Ioannidis, C. G. Theodorou, S. Haendler, E. Josse, C. A. Dimitriadis, G. Ghibaudo

Institutions: Institut de Microélectronique, Electromagnétisme et Photonique, STMicroelectronics (France), Aristotle University of Thessaloniki

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2024196742

FWCI: 2.378

Cites: 8

Cited by: 40

Related to: 10