Defect-state generation in Czochralski-grown (100) silicon rapidly annealed with incoherent light
Year: 1987
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.338848
Authors: D. Barbier, M. Remram, J. F. Joly, A. Laugier
Institution: Institut National des Sciences Appliquées de Lyon
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2024947418