Work

Spatial versus temporal phase shifting in electronic speckle-pattern interferometry: noise comparison in phase maps

Year: 2000

Type: article

Source: Applied Optics

DOI: 10.1364/ao.39.004598

Authors: Jan Burke, Heinz Helmers

Institution: Carl von Ossietzky Universität Oldenburg

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2024977305

FWCI: 1.308

Cites: 22

Cited by: 38

Related to: 10