Work

Submicron-scale depth profiling of residual stress in amorphous materials by incremental focused ion beam slotting

Year: 2012

Type: article

Source: Acta Materialia

DOI: 10.1016/j.actamat.2011.12.035

Authors: B. Winiarski, A. Gholinia, J. Tian, Y. Yokoyama, P.K. Liaw, P.J. Withers

Institutions: University of Manchester, University of Tennessee at Knoxville, Tohoku University

Language: English

Topic: Surface Treatment and Residual Stress

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Engineering and Physical Sciences Research Council, Japan Society for the Promotion of Science

Awards: 3D Assessment of Surface Integrity and Performance, Fabrication of high quality cast amorphous/heteroamorphous alloys with a small amount of cast defects

OpenAlex ID: W2025751336

FWCI: 7.882

Cites: 69

Cited by: 34

Related to: 10