Work

Reliability and Sensitivity Analysis of Embedded Systems with Modular Dynamic Fault Trees

Year: 2005

Type: conference-paper

Source: IEEE Region 10 Conference (TENCON)

DOI: 10.1109/tencon.2005.300968

Authors: Hsiang-kai Lo, Chin-yu Huang, Yung-ruei Chang, Wei-chih Huang, Jun-ru Chang

Institutions: National Tsing Hua University, Atomic Energy Council, Institute of Nuclear Energy Research

Language: English

Topic: Risk and Safety Analysis

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2029411416

FWCI:

Cites: 15

Cited by: 6

Related to: 10