Work

Characterization of porous silicon layers by grazing- incidence X-ray fluorescence and diffraction

Year: 1991

Type: article

Source: Solid State Communications

DOI: 10.1016/0038-1098(91)90444-z

Authors: A. Bensaid, G. Patrat, M. Brunel, F. de Bergevin, R. Hérino

Institutions: Centre National de la Recherche Scientifique, Université Joseph Fourier

Language: English

Topic: Silicon Nanostructures and Photoluminescence

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2029477258

FWCI: 3.066

Cites: 8

Cited by: 49

Related to: 10