Work

Ir Diffusion Barriers in Ni/Au Ohmic Contacts to p-Type CuCrO2

Year: 2007

Type: article

Source: Journal of Electronic Materials

DOI: 10.1007/s11664-007-0334-y

Authors: W.T. Lim, P.W. Sadik, D.P. Norton, B.P. Gila, S.J. Pearton, I.I. Kravchenko, F. Ren

Institution: University of Florida

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2032430786

FWCI: 0.204

Cites: 38

Cited by: 2

Related to: 10