Work

Two-dimensional simulation of the thermal stress effect on static and dynamic VDMOS characteristics

Year: 2005

Type: article

Source: Materials Science and Engineering B

DOI: 10.1016/j.mseb.2005.08.092

Authors: M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter

Institutions: Université de Rouen Normandie, Lebanese University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2036246748

FWCI: 0.615

Cites: 14

Cited by: 8

Related to: 10