Work

VIA-4 avalanche-induced breakdown mechanisms in short-channel MOSFETs

Year: 1982

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/t-ed.1982.20998

Authors: F.-C. Hsu, P.K. Ko, S. Tam, C. Hu, R.S. Muller

Institution: University of California, Berkeley

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2038863955

FWCI: 1.083

Cites:

Cited by: 60

Related to: 10