Work

Time-resolved scanning near-field microscopy of InGaN laser diode dynamics

Year: 2006

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.662019

Authors: U. T. Schwarz, C. Lauterbach, M. O. Schillgalies, C. Rumbolz, M. Furitsch, A. Lell, V. Härle

Institutions: University of Regensburg, Osram Opto Semiconductors

Language: English

Topic: Near-Field Optical Microscopy

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2040405652

FWCI: 8.425

Cites: 20

Cited by: 11

Related to: 10