Work

The statistical analysis of individual defects constituting NBTI and its implications for modeling DC- and AC-stress

Year: 2010

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2010.5488858

Authors: Hans Reisinger, Tibor Grasser, Wolfgang Gustin, Christian Schlunder

Institutions: Infineon Technologies (Germany), TU Wien

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2040887205

FWCI: 29.65

Cites: 24

Cited by: 205

Related to: 10