Work

Measurement of the dielectric constant of thin films by terahertz time-domain spectroscopic ellipsometry

Year: 2011

Type: article

Source: Optics Letters

DOI: 10.1364/ol.36.000265

Authors: Naoki Matsumoto, Tadasu Hosokura, Takeshi Nagashima, Masanori Hangyo

Institutions: Murata (Japan), Institute of Laser Engineering, The University of Osaka

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2043661301

FWCI: 5.635

Cites: 13

Cited by: 87

Related to: 10