Work

Advanced large-format InSb IR FPA maturation at CMC Electronics

Year: 2004

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.542699

Authors: Rich Rawe, A. Timlin, Mike Davis, John W. Devitt, Mark Greiner

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2043740842

FWCI:

Cites:

Cited by: 6

Related to: 10