Use of a general imaging model to achieve predictive autofocus in the scanning electron microscope
Year: 1997
Type: article
Source: Ultramicroscopy
Authors: F.C. Nicolls, G. de Jager, B.T. Sewell
Institution: University of Cape Town
Language: English
Subfield: Media Technology
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2043761848
