Work

Characterisation of mesostructured TiO2 thin layers by ellipsometric porosimetry

Year: 2005

Type: article

Source: Thin Solid Films

DOI: 10.1016/j.tsf.2005.08.334

Authors: V. Rouessac, R. Coustel, F. Bosc, J. Durand, A. Ayral

Institutions: École Nationale Supérieure de Chimie de Montpellier, Centre National de la Recherche Scientifique, Institut Européen des Membranes

Language: English

Topic: Mesoporous Materials and Catalysis

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2043934769

FWCI: 1.461

Cites: 25

Cited by: 29

Related to: 10