Work

Comprehensive test of low-level-light image intensifiers

Year: 1996

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.253086

Authors: Yu Liu, Yueqin Ma, Junyan Jiang, Jifang Shi

Language: English

Topic: Advanced Measurement and Detection Methods

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2043948903

FWCI: 1.466

Cites:

Cited by: 2

Related to: 10