Work

Mobility strain response and low temperature characterization of Ge p-MOSFETs

Year: 2013

Type: conference-paper

Source: Conference digest

DOI: 10.1109/drc.2013.6633799

Authors: I-Hsieh Wong, Yen-Ting Chen, Huang-Jhih Ciou, Yu-Sheng Chen, Jhih-Yang Yan, Chee Wee Liu

Institution: National Taiwan University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2047560922

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